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Single-Photon Imaging

15th June 2009
International Congress Centre Munich, Germany

Single-Photon Imaging

This is a sub-conference of Frontiers in Electronic Imaging, held under the umbrella of the WORLD OF PHOTONICS CONGRESS 2009, from 15 - 17 June, 2009. Please click here to download the Call for papers.

Synopsis

Because of the quantum nature of light, any type of image sensor has the same fundamental limit: Once every impinging photon can be detected, the ultimate limit has been reached. Several techniques have been demonstrated with which this goal can be attained, such as the Skipper CCD, Avalanche Photodetectors (APD), charge detection stages with low-capacitance input devices such as double-gate FETs, massively parallel signal processing for bandwidth and noise reduction, in-pixel amplification and pulse shaping, etc.
None of these techniques has yet found wide-spread applications, and “consumer night vision” has yet to arrive. However, the various approaches have matured today to a point where single-photon imaging in cell phone cameras is a distinct possibility for the near future.

Topics include, but are not limited to:

  • Electron Multiplication Charge Coupled Devices (EMCCD)
  • Linear-mode APD pixels and image sensors
  • Geiger-mode avalanche pixels and image sensors
  • Double-gate field effect transistors (DG-FET) for image sensing
  • Charge modulation device (CMD) image sensors
  • Charge-averaging techniques with CCD pixels
  • In-pixel circuits for single-photon detection
  • Smart pixels with noise reduction functionality
  • Ultra-low-noise CCD and CIS fabrication processes
  • Architectures for low-noise CCD and CMOS image sensors
  • Application examples with record performance

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Chairs

  • Peter Seitz, University of Neuchatel and CSEM Nanomedicine, Landquart (CH)   
  • Shoji Kawahito, Shizuoka University, Hamamatsu (JP)

Scientific Committee

  • Peter Seitz, University of Neuchatel and CSEM Nanomedicine, Landquart (CH)
  • Edoardo Charbon, Technical University Delft (NL)
  • Bart Dierickx, Caeleste CVBA, Antwerp (BE)
  • Boyd Fowler, Fairchild Imaging Inc., Milpitas (US)
  • Shoji Kawahito, Shizuoka University, Hamamatsu (JP)
  • Stefan Lauxtermann, Teledyne Imaging Sensors, Camarillo (US)
  • Andrea Simoni, ITC-irst, Trento (IT)

Invited Speaker

  • Mark Robbins, e2v technologies plc., Chelmsford (UK)

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Abstract Submission and Deadlines

  • Submission will open in December 2008 
  • Deadline for submission  of abstracts: 26 January 2009
  • Notification to authors: 19 February 2009
  • Publication of the programme: April 2009

Prospective authors are requested to submit an abstract covering a minimum of half a page and a maximum of two pages. All accepted abstracts will be published in the EOS Conference digest that will be available on-site at the beginning of the conference.  Abstracts shall be submitted online at www.myeos.org/MUNICH2009 with the responsible author’s contact data. The EOS guidelines for abstracts can be downloaded at www.myeos.org/abstractguidelines. Submission will open at a later date.

JEOS:RP - Special Publication Offer

The authors of accepted abstracts receive a 20% discount on the publication rate for JEOS:RP, the e-journal of the European Optical Society (www.jeos.org). The paper submitted to JEOS:RP must be an original contribution that is connected to the conference presentation and must be submitted no later than 15 August, 2009. The publication rate for authors of the event is 280€ (instead of 350€).

Registration

The registration for this EOS conference includes admission to all conferences of the WORLD OF PHOTONICS CONGRESS 2009 as well as to the LASER World of PHOTONICS 2009 exhibition. Please register via the EOS online shop at www.myeos.org/shop. Deadline for early-bird registration: 4 May 2009.

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Contact

European Optical Society (EOS)
Judith Herzog
Event & Account Management
Hollerithallee 8
30419 Hannover, Germany

Phone: +49-511-2788-159
Fax: +49-511-2788-119

E-mail: munich@myeos.org
URL: www.myeos.org/MUNICH2009

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